Thin
Film Metrology & In Situ Process Control
HORIBA
Jobin Yvon - Thin Film Division provides advanced thin film metrology, processing
and plasma diagnostic instruments for research, industrial and
quality control applications.
Our core technologies include: Ellipsometry, Reflectometry, Optical Emission Spectroscopy, Interferometry and Polarimetry either as single techniques or in combination for powerful customized solutions.
Solutions for:
Thin Film Metrology |
In Situ Process Control |
 |
 |
 |
