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Location: Products >> X-Ray Fluorescence >> Micro-XRF Analyzer >> Features
Analytical Solutions
Various analytical problems and difficulties, solved with the XGT.

The introduction of an XGT system into a laboratory provides fundamental solutions to a wide-range of analytical work problems, problems that could not be solved with conventional systems.

In this section, we examine some specific examples of these problems, looking at the factors that caused the problems and the ways in which they were solved with the XGT instruments.

It takes a lot of time and effort to cut cross sections of foreign substances

The process of cutting out a sample could take half a day and the foreign substance sample could be damaged or completely destroyed during the cutting process.

The XGT solves this problem! - in situ analysis from within a sample

You need to perform elemental analysis for a sample containing water

Too much time and work is involved in drying the sample.
The sample would be destroyed if it were dried.

The XGT solves this problem! - analysis at atmospheric pressure

You need to locate a malfunction on a circuit board without damage

You have no idea where the malfunction is.
You need to analyze the circuit board as a complete unit.
If the circuit board is disassembled, it will be impossible to locate the malfunction.

The XGT solves this problem! - non-destructive analysis

You need to analyze a large sample

With conventional systems, there is no way to check for uneven element distribution over a large area.
It would take a lot of time and effort to divide a large sample into smaller pieces and to perform repeated analyses.

The XGT solves this problem! - mapping analysis up to 100 mm x 100 mm

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