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Spectroscopic ellipsometer allows the accurate characterisation of a range of properties including the layer thickness, optical constants, composition, crystallinity, anisotropy, and uniformity. Thickness determinations ranging from a few angstroms to tens of microns are possible for single layers and complex multilayer stacks.

UVISEL   Spectroscopic Ellipsometer VUV to NIR : 142 to 2100 nm	MM-16   Affordable VIS Spectroscopic Ellipsometer	Options   For UVISEL & MM-16 Spectroscopic Ellipsometers
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UVISEL VIP   Integrated Spectroscopic Ellipsometer & Reflectometer	Auto SE   Simple Thin Film Measurement Tool !
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