Photoluminescence (PL)
Photoluminescence spectroscopy is a non-contact, nondestructive method of probing the electronic structure of materials. In essence, light is directed onto a sample, where it is absorbed and where a process called photo-excitation can occur. The photo-excitation causes the material to jump to a higher electronic state, and will then release energy, (photons) as it relaxes and returns to back to a lower energy level. The emission of light, or luminescence through this process is photoluminescence, PL.
Photoluminescence spectrometers from HJY provide :
Our PL optimised series of spectrometers developed from our core spectroscopy expertise are used for wide-ranging evaluations, including compositional analysis of the epitaxial layer of compound semiconductors, defect evaluation of light-emitting materials, evaluation of surfaces, non-destructive evaluation of integrated optical circuits, quantitative analysis of impurities, and evaluation of various Laser Diodes and LEDs ranging from GaN to InP.
Theses products are also making a major contribution to the development of ultra-high-speed devices, quantum small-gauge nano-wires, quantum dots, and new materials such as SWCNTs.
Typical applications include :
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- Confocal Mapping capabilities with sub-micron spatial resolution
- Various excitation wavelengths from the UV- NIR allowing control of the penetration depth into the material, and thus, control of the volume sampled.
- Detection of photoluminescence from UV to NIR using CCD and InGaAs/NIR detection.
- Sample temperature cells from 4 to 300 K.
 PL Mapper |
| Low Temperature PL |
| PL Sub-Micron Scale |
| III-V Semiconductor Devices |
| Si Nanowires |
| Raman/PL microscopes |
