Location: News >> Spectroscopic Ellipsometer: Did you measure all of the Data?
Spectroscopic
Ellipsometer Did you measure all of the Data?
HORIBA
Jobin Yvon introduces the MM16 Mueller Matrix spectroscopic
ellipsometer to its product line of ellipsometric tools
for advanced characterization of a broad range of materials
and thin films for compounds, alloys, semiconductors, and
organics. The MM16 is exemplified by fast measurements,
with no mechanical movements, of the Mueller matrix and
determines the optical constants, thickness, surface characteristics,
stoichiometry, compositional uniformity, crystallinity,
and anisotropy/birefringence. With data acquisition times
from 2 seconds, small form factor, and optional components
for both ex-situ and in-situ configurations, the MM16 is
now the most cost effective spectroscopic ellipsometer
available for material analysis.
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