Location: News
Current News
- Powerful DeltaPsi2 Software Platform for Ellipsometry, Reflectometry and Polarimetry by HORIBA Jobin Yvon
- HORIBA Particle Sizing Demonstration Laboratory
- HORIBA Jobin Yvon New Auto SE Wins 2008 IC Industry New System Award
- NanoCharM organized the "1st European School on Ellipsometry"
- NanoCharm Questionnaire on Ellipsometers for Nano Applications
- UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module
- HORIBA Jobin Yvon Ltd are holding a series of Micro Analysis symposia in Ireland from the 1st to the 3rd of July.
- PSA300 Particle Size and Shape Analyser- Measures Exactly What You See
- Simple Thin Film Measurement with the Auto SE
- HORIBA Jobin Yvon introduce the XploRA – the Smart Raman Microscope
- ACTIVA-S: An affordable, easy-to-use solution for ICP-AES analysis
- Raman Imaging at the Speed of Light: SWIFTTM and DuoScanTM - New Fast Scanning Raman Technology
- SLICE: A New XRF Methodology and Library for sample Identification and archiving
- LA-300 Compact, Portable, and Affordable Particle Size Analysis
- The XGT-7000 XRF Imaging Microscope with 10µm resolution
- 2007 Masao Horiba Award Winners Announced
- OEM electronics for Hamamatsu® and e2v® linear CCDs
- CLUE: Spectroscopic Accressory for SEMs
- FluorEssence Software for FluoroLog or FluoroMax
- XGT1700 WR and XGT-5700 WR EDXRF Imaging Microscope
- OEM Miniature Raman Components and Systems
- ACTIVA-M, the Master in True Multi-line Analysis
- MultiFrequency Fluorometry
- Try out a Spectroscopic Ellipsometer today and find out what it can do for your research
- Multichannel Detectors for every Occasion
- ACTIVA-M Wins Editors' Best New Product Bronze Award at Pittcon 2007
Click Here for Past News.
